Exploring the Nanoscale: Atomic Force Microscopy (AFM) Surface Topography Imaging
Exploring the Nanoscale: Atomic Force Microscopy (AFM) Surface Topography Imaging In the ever-evolving field of nanotechnology, the ability to visualize and analyze surfaces at the atomic level is crucial. One of the most powerful tools enabling this is Atomic Force Microscopy (AFM). Unlike traditional optical or electron microscopes, AFM provides high-resolution 3D surface topography at the nanoscale, offering detailed insights into material properties. What is Atomic Force Microscopy (AFM)? AFM is a type of scanning probe microscopy (SPM) that utilizes an ultra-sharp probe to scan the surface of a material. This probe interacts with the surface forces, capturing minute variations in height, roughness, and texture. The result? A highly accurate, three-dimensional map of the surface—essential for researchers in fields like:Nanomaterials & Nanostructures – Understanding surface morphology of nanoparticles and nanofilms. Biomaterials & Life Sciences – Studying protein structures,...